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您訪問的GI20干涉儀產品信息，由北京華沛智同科技發展有限公司自行發布提供，產品價格為面議，如您想了解更多關于GI20干涉儀型號、參數、用途等信息，歡迎咨詢。
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GI20干涉儀詳細信息
The GI20 grazing incidence interferometer provides high precision flatness measurement, suitable for use with lapped and semi-polished surfaces up to 150mm (6”)Ø. Unlike conventional fizeau interferometers, the GI20 can measure
non-reflective surfaces, ideal for analysing lapped and/or ground surfaces prior to final polishing. The interferogram is displayed on a LCD screen on the front of the unit.
• High precision flatness measurement of ground, lapped or semi-polished samples
• Measure 2μm per fringe with excellent clarity
• Surface roughness measurement from 1nm to 300nm Ra
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